Thin Film Thickness Measurements with the New 20/20 Film(TM) from CRAIC Technologies

CRAIC Technologies, the leading manufacturer of UV-visible-NIR microscopes and microspectrometers, is pleased to announce the 20/20 Film(TM) microspectrophotometer. The 20/20 Film(TM) solution is designed to measure the thickness of thin films of even sub-micron sampling areas rapidly and non-destructively. Able to analyze films of many materials on both transparent and opaque substrates, the 20/20 Film(TM) enables the user to determine thin film thickness on everything from semiconductors to MEMS devices to hard disk drives to flat panel displays. When combined with CRAIC Technologies proprietary contamination imaging capabilities, the 20/20 Film(TM) represents a major step forward in capabilities and flexibility for the semiconductor, flat panel display and the hard disk drive markets. 

"Many of our customers want to measure the thickness of thin films of smaller and smaller sampling areas for rapid quality control of their products. The 20/20 Film(TM) microspectrophotometer was built in response to customer requests for a powerful, flexible film thickness tool that can measure sub-micron areas on both transparent and opaque substrates." says Dr. Paul Martin, President of CRAIC Technologies. "This tool can also do a lot more than just measure thin film thickness. It can also be configured for contamination analysis, concentration and relative intensity mapping and much more."

The complete 20/20 Film(TM) solution combines advanced microspectroscopy with sophisticated software to enable the user to measure film thickness by either transmission or reflectance of many types of films and substrates. Due to the flexibility of the CRAIC Technologies design, sampling areas can range from over 100 microns across to less than a micron. Designed for the production environment, it incorporates a number of easily modified processing recipes, the ability to create new film recipes and sophisticated tools for analyzing data as well as options for automation including touchscreen control. The ability to directly image and analyze films with ultraviolet, visible and NIR microscopy can also be added to this instrument. 

Morales R. Karelis

CI 18089995

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